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A Beginners' Guide to Scanning Electron MicroscopyCharacteristics of X-Rays

A Beginners' Guide to Scanning Electron Microscopy: Characteristics of X-Rays [In addition to the generation of backscattered and secondary electrons, the interaction of an electron beam with the specimen material releases x-rays which are used to undertake elemental analysis using energy−/wavelength-dispersive x-ray spectroscopy. Characteristics of x-rays are described in this chapter.] http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png

A Beginners' Guide to Scanning Electron MicroscopyCharacteristics of X-Rays

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Publisher
Springer International Publishing
Copyright
© Springer Nature Switzerland AG 2018
ISBN
978-3-319-98481-0
Pages
233 –264
DOI
10.1007/978-3-319-98482-7_6
Publisher site
See Chapter on Publisher Site

Abstract

[In addition to the generation of backscattered and secondary electrons, the interaction of an electron beam with the specimen material releases x-rays which are used to undertake elemental analysis using energy−/wavelength-dispersive x-ray spectroscopy. Characteristics of x-rays are described in this chapter.]

Published: Oct 27, 2018

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