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A Beginners' Guide to Scanning Electron MicroscopyIntroduction

A Beginners' Guide to Scanning Electron Microscopy: Introduction [The word microscope is derived from Greek micros (small) and skopeo (look at). Just like any microscope, the primary function of the scanning electron microscope (SEM) is to enlarge small features or objects otherwise invisible to human sight. It does that by way of using electron beam rather than light which is used to form images in optical light microscopes. The images are obtained by scanning an electron beam of high energy on the sample surface, hence the name scanning electron microscope. By virtue of its smaller wavelength, electrons are able to resolve finer features/details of materials to a much greater extent compared with optical light. A modern day SEM can magnify objects up to one million times their original size and can resolve features smaller than 1 nm in dimension. Similarly, electron beam interaction with the specimen emits x-rays with unique energy that can be detected to determine the composition of material under examination. The SEM is, therefore, a tool used for materials characterization that provides information about the surface or near surface structure, composition, and defects in bulk materials. It allows scientists to observe surfaces at submicron and nano-level to elaborate material properties. It has emerged as one of the most powerful and versatile instruments equally valuable to materials and life scientists working in wide-ranging industries.] http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png

A Beginners' Guide to Scanning Electron MicroscopyIntroduction

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/lp/springer-journals/a-beginners-guide-to-scanning-electron-microscopy-introduction-1DgzQpUwy0
Publisher
Springer International Publishing
Copyright
© Springer Nature Switzerland AG 2018
ISBN
978-3-319-98481-0
Pages
1 –14
DOI
10.1007/978-3-319-98482-7_1
Publisher site
See Chapter on Publisher Site

Abstract

[The word microscope is derived from Greek micros (small) and skopeo (look at). Just like any microscope, the primary function of the scanning electron microscope (SEM) is to enlarge small features or objects otherwise invisible to human sight. It does that by way of using electron beam rather than light which is used to form images in optical light microscopes. The images are obtained by scanning an electron beam of high energy on the sample surface, hence the name scanning electron microscope. By virtue of its smaller wavelength, electrons are able to resolve finer features/details of materials to a much greater extent compared with optical light. A modern day SEM can magnify objects up to one million times their original size and can resolve features smaller than 1 nm in dimension. Similarly, electron beam interaction with the specimen emits x-rays with unique energy that can be detected to determine the composition of material under examination. The SEM is, therefore, a tool used for materials characterization that provides information about the surface or near surface structure, composition, and defects in bulk materials. It allows scientists to observe surfaces at submicron and nano-level to elaborate material properties. It has emerged as one of the most powerful and versatile instruments equally valuable to materials and life scientists working in wide-ranging industries.]

Published: Oct 27, 2018

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