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[The methods presented before in Chaps. 2, 3, and 5 concentrate on form deviations, topography, roughness, and waviness. In principle, also dimensional deviations, position deviations and defect inspection can be accomplished by these methods. More common is to use imaging and image processing as the main processes for measurement and evaluation for these more coarse deviations.]
Published: Jan 2, 2020
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